JPH01105855U - - Google Patents

Info

Publication number
JPH01105855U
JPH01105855U JP190688U JP190688U JPH01105855U JP H01105855 U JPH01105855 U JP H01105855U JP 190688 U JP190688 U JP 190688U JP 190688 U JP190688 U JP 190688U JP H01105855 U JPH01105855 U JP H01105855U
Authority
JP
Japan
Prior art keywords
phosphorus
rays
fluorescent
nickel
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP190688U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP190688U priority Critical patent/JPH01105855U/ja
Publication of JPH01105855U publication Critical patent/JPH01105855U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP190688U 1988-01-11 1988-01-11 Pending JPH01105855U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP190688U JPH01105855U (en]) 1988-01-11 1988-01-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP190688U JPH01105855U (en]) 1988-01-11 1988-01-11

Publications (1)

Publication Number Publication Date
JPH01105855U true JPH01105855U (en]) 1989-07-17

Family

ID=31202204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP190688U Pending JPH01105855U (en]) 1988-01-11 1988-01-11

Country Status (1)

Country Link
JP (1) JPH01105855U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06123717A (ja) * 1992-10-11 1994-05-06 Horiba Ltd 複数条件螢光ｘ線定性分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57125834A (en) * 1981-01-22 1982-08-05 Le Nauchinoopuroizubuodosutobu Fluorescent x rays spectrometer
JPS61170606A (ja) * 1985-01-24 1986-08-01 Seiko Instr & Electronics Ltd 螢光ｘ線膜厚計

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57125834A (en) * 1981-01-22 1982-08-05 Le Nauchinoopuroizubuodosutobu Fluorescent x rays spectrometer
JPS61170606A (ja) * 1985-01-24 1986-08-01 Seiko Instr & Electronics Ltd 螢光ｘ線膜厚計

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06123717A (ja) * 1992-10-11 1994-05-06 Horiba Ltd 複数条件螢光ｘ線定性分析方法

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